Element/material analysis
Microprobe Analyzer with EDX and WDX
Element/material analysis - Image 3
Element/material analysis - Image 4

Element/material analysis

Energy and wavelength dispersive X-ray microanalysis (EDX, WDX)

  • Detection of all elements in the atomic number range Z= 4 (beryllium) to Z= 92 (uranium)
  • Possibility of element mappings, point and line analyses with high spatial resolution
  • Fully quantitative (standard-related) analyses with high detection capability down to < 100 wt-ppm

Electron Backscatter Diffraction (EBSD)

  • EDAX OIM XM4 EBSD-Detector with Digiview 1612 Camera
  • EBSD orientation mapping
Categories: ,

Description

Electron beam microprobe JEOL JXA-8800L

  • 4 wavelength-dispersive Johansson-type crystal spectrometers
  • 1 nitrogen-free, energy-dispersive spectrometer Bruker XFlash 5010
  • Precise sample stage for max. 4″ samples
  • Detectors for material and topography contrast

Analytical electron microscopes with energy dispersive spectrometers

  • JEOL JSM-6700F with Bruker XFlash 7
  • Tescan LYRA XMU with Bruker XFlash 7
  • TEM Hitachi HT7820 with Bruker XFlash 7

Offer | Contact

Dellith

Dr. Jan Dellith
Your contact for material and microstructure analysis

Phone: +49 (0) 3641 · 206-104
Email: jan.dellith@leibniz-ipht.de

Related products